AEI Standard
40.00 €Tungsten source for Zeiss, LEO, AEI, Cambridge Instrument, Novascan, Leica & Nanoquest Electron Microscope
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ARL
40.00 €Tungsten source for ISI & ABT Electron Microscopes
Cameca type
40.00 €Tungsten source for Cameca Electron Probe MicroAnalyzer CAMEBAX, SX-50, SX-100 and SX-FIVE
Custom x-ray source filaments
All instruments, ideal for research and innovation
ETEC
40.00 €Tungsten source for ETEC Electron Microscopes
FEI & Philipps
40.00 €Tungsten source for FEI & Philipps Electron Microscopes
Hitachi S-type
40.00 €Tungsten source for Hitachi TM3030 Plus, TM3030, TM3000, TM1000, S3400N, S3700N, SU1500, SU1510 & SU35000 Electron Microscopes
ISI
40.00 €Tungsten source for ISI & ABT Scanning Electron Microscope
Jeol K-type
40.00 €Tungsten source for Jeol SEM & TEM. Filament can be aligned through its cartridge.
JMS35
40.00 €Tungsten source for Jeol Electron Microscopes
Philipps
40.00 €Tungsten source for FEI & Philipps Electron Microscopes
Zeiss
40.00 €Tungsten source for Zeiss Scanning Electron Microscope